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MOC3051M, moc3052m ?6-pin dip random-phase optoisolators triac drivers (600 volt peak) ?005 fairchild semiconductor corporation www.fairchildsemi.com MOC3051M, moc3052m rev. 1.0.5 september 2009 MOC3051M, moc3052m 6-pin dip random-phase optoisolators triac drivers (600 volt peak) features excellent i ft stability?r emitting diode has low degradation high isolation voltage?inimum 7500 peak vac underwriters laboratory (ul) recognized file #e90700, volume 2 600v peak blocking voltage iec60747-5-2 approved (file #94766) ordering option v (e.g. moc3052vm) applications solenoid/valve controls lamp ballasts static ac power switch interfacing microprocessors to 115 and 240 vac peripherals solid state relay incandescent lamp dimmers temperature controls motor controls description the MOC3051M and moc3052m consist of a algaas infrared emitting diode optically coupled to a non-zero- crossing silicon bilateral ac switch (triac). these devices isolate low voltage logic from 115 and 240 vac lines to provide random phase control of high current triacs or thyristors. these devices feature greatly enhanced static dv/dt capability to ensure stable switching performance of inductive loads. schematic package outlines main term. nc* n/c *do not connect (triac substrate) 1 2 3 anode cathode 4 5 6 main term.
?005 fairchild semiconductor corporation www.fairchildsemi.com MOC3051M, moc3052m rev. 1.0.5 2 MOC3051M, moc3052m ?6-pin dip random-phase optoisolators triac drivers (600 volt peak) absolute maximum ratings (t a = 25? unless otherwise specified.) stresses exceeding the absolute maximum ratings may damage the device. the device may not function or be operable above the recommended operating conditions and stressing the parts to these levels is not recommended. in addition, extended exposure to stresses above the recommended operating conditions may affect device reliability. the absolute maximum ratings are stress ratings only. note: 1. isolation surge votlage, v iso , is an internal device breakdown rating. for this text, pins 1 and 2 are common, and pins 4, 5 and 6 are common. symbol parameters value units tot al device t stg storage temperature -40 to +150 ? t opr operating temperature -40 to +85 ? t sol lead solder temperature (wave solder) 260 for 10 sec ? t j j unction temperature range -40 to +100 ? v iso isolation surge voltage (1) (peak ac voltage, 60hz, 1 sec. duration) 7500 vac(pk) p d t otal device power dissipation @ 25? derate above 25? 330 mw 4.4 mw/? emitter i f continuous forward current 60 ma v r reverse voltage 3 v p d t otal device power dissipation @ 25? derate above 25? 100 mw 1.33 mw/? detector v drm off-state output terminal voltage 600 v i tsm p eak repetitive surge current (pw = 100 s, 120pps) 1 a p d t otal power dissipation @ 25? ambient derate above 25? 300 mw 4 mw/?
?005 fairchild semiconductor corporation www.fairchildsemi.com MOC3051M, moc3052m rev. 1.0.5 3 MOC3051M, moc3052m ?6-pin dip random-phase optoisolators triac drivers (600 volt peak) electrical characteristics (t a = 25? unless otherwise speci?d.) individual component characteristics t ransfer characteristics isolation characteristics *typical values at t a = 25? notes: 2. test voltage must be applied within dv/dt rating. 3. all devices are guaranteed to trigger at an i f value less than or equal to max i ft . therefore, recommended operating i f lies between max. 15a for MOC3051M, 10ma for moc3052m and absolute max. i f (60ma). symbol parameters test conditions min. typ.* max. units emitter v f input forward voltage i f = 10ma 1.18 1.5 v i r reverse leakage current v r = 3v 0.05 100 ? detector i drm p eak blocking current, either direction v drm , i f = 0 (2) 10 100 na v tm p eak on-state voltage, either direction i tm = 100ma peak, i f = 0 1.7 2.5 v dv/dt critical rate of rise of off-state voltage i f = 0 (figure 7, @ 400v) 1000 v/? symbol dc characteristics test conditions device min. typ.* max. units i ft led trigger current, either direction main terminal v oltage = 3v (3) MOC3051M 15 ma moc3052m 10 i h holding current, either direction all 220 ? symbol characteristic test conditions min. typ.* max. units v iso input-output isolation v oltage f = 60hz, t = 1 sec. 7500 vac(pk) r iso isolation resistance v i-o = 500vdc 10 11 ? c iso isolation capacitance v = 0v, f = 1mhz 0.2 pf
?005 fairchild semiconductor corporation www.fairchildsemi.com MOC3051M, moc3052m rev. 1.0.5 4 MOC3051M, moc3052m ?6-pin dip random-phase optoisolators triac drivers (600 volt peak) safety and insulation ratings as per iec 60747-5-2, this optocoupler is suitable for ?afe electrical insulation?only within the safety limit data. compliance with the safety ratings shall be ensured by means of protective circuits. symbol parameter min. typ. max. unit installation classi?ations per din vde 0110/1.89 ta b le 1 f or rated main voltage < 150vrms i-iv f or rated main voltage < 300vrms i-iv climatic classi?ation 55/100/21 p ollution degree (din vde 0110/1.89) 2 cti comparative tracking index 175 v pr input to output test voltage, method b, v iorm x 1.875 = v pr , 100% production test with tm = 1 sec, partial discharge < 5pc 1594 v peak input to output test voltage, method a, v iorm x 1.5 = v pr , type and sample test with tm = 60 sec, partial discharge < 5pc 1275 v peak v iorm max. working insulation voltage 850 v peak v iotm highest allowable over voltage 6000 v peak external creepage 7 mm external clearance 7 mm insulation thickness 0.5 mm rio insulation resistance at ts, v io = 500v 10 9 ?
?005 fairchild semiconductor corporation www.fairchildsemi.com MOC3051M, moc3052m rev. 1.0.5 5 MOC3051M, moc3052m ?6-pin dip random-phase optoisolators triac drivers (600 volt peak) t ypical performance curves i f vs. temperature (normalized) figure 3 shows the increase of the trigger current when the device is expected to operate at an ambient temper- ature below 25?. multiply the normalized i ft shown this graph with the data sheet guaranteed i ft . example: t a = -40?, i ft = 10 ma i ft @ -40? = 10 ma x 1.4 = 14 ma phase control considerations led trigger current versus pw (normalized) random phase triac drivers are designed to be phase controllable. they may be triggered at any phase angle within the ac sine wave. phase control may be accom- plished by an ac line zero cross detector and a variable pulse delay generator which is synchronized to the zero cross detector. the same task can be accomplished by a microprocessor which is synchronized to the ac zero crossing. the phase controlled trigger current may be a very short pulse which saves energy delivered to the input led. led trigger pulse currents shorter than 100? must have an increased amplitude as shown on figure 4. this graph shows the dependency of the trigger current i ft versus the pulse width can be seen on the chart delay t(d) versus the led trigger current. i ft in the graph i ft versus (pw) is normalized in respect to the minimum specified i ft for static condition, which is specified in the device characteristic. the normalized i ft has to be multiplied with the devices guaranteed static trigger current. example: guaranteed i ft = 10 ma, trigger pulse width pw = 3? i ft (pulsed) = 10 ma x 5 = 50ma figure 3. trigger current vs. ambient temperature figure 4. led current required to trigger vs. led pulse width i ft - trigger curre nt (normal ized) figure 1. led forward voltage vs. forward current v f - forward voltage (v) figure 2. on-state characteristics - on-state current (ma) i m i ft - normalized led trigger current i f - led forward current (ma) 110 100 0.9 1.0 1.1 1.2 1.3 1.4 1.5 1.6 1.7 t a = -40? t a = 25? t a = 85? v tm - on-state voltage (v) -3 -2 -1 0 1 2 3 -600 -400 -200 0 200 400 600 t a - ambient temperature (?) -40 -20 0 20 40 60 80 100 0.6 0.8 1.0 1.2 1.4 normalized to t a = 25? pw in - led trigger pulse width (s) 110 100 0 5 10 15 normalized to: pw in > 100s
?005 fairchild semiconductor corporation www.fairchildsemi.com MOC3051M, moc3052m rev. 1.0.5 6 MOC3051M, moc3052m ?6-pin dip random-phase optoisolators triac drivers (600 volt peak) figure. 7 leakage current, i drm vs. temperature figure. 6 holding current, i h vs. temperature t a - ambient temperature ( o c) -40 -20 0 20 40 60 80 100 i drm - leakage current (na) 0.1 1 10 100 1000 t a - ambient temperature ( o c) i h - holding cu rrent (ma) -40 1.0 0.9 0 -30 -20 -10 0 10 20 30 4 050607080 0.8 0.7 0.6 0.5 0.4 0.3 0.2 0.1 dv/dt (v/ms) 0.001 1.5 0.5 10000 normalized to: i ft at 3 v i ft - led trigger current (normalized) 1.4 1.3 1.2 1.1 1 0.9 0.8 0.7 0.6 0.01 0.1 1 10 100 1000 figure. 8 led trigger current, i ft vs. dv/dt figure 5. minimum time for led turn?off to zero cross of ac trailing edge ac sine 0 180 led pw led current led turn off min. 200 s minimum led off time in phase control applications in phase control applications one intends to be able to control each ac sine half wave from 0?to 180? turn on at 0?means full power and turn on at 180?means zero power. this is not quite possible in reality because triac driver and triac have a fixed turn on time when activated at zero degrees. at a phase control angle close to 180 the driver? turn on pulse at the trailing edge of the ac sine wave must be limited to end 200ms before ac zero cross as shown in figure 5. this assures that the triac driver has time to switch off. shorter times may cause loss of control at the following half cycle. i ft versus dv/dt triac drivers with good noise immunity (dv/dt static) have internal noise rejection circuits which prevent false triggering of the device in the event of fast raising line voltage transients. inductive loads generate a commutat- ing dv/dt that may activate the triac drivers noise sup- pression circuits. this prevents the device from turning on at its specified trigger current. it will in this case go into the mode of ?alf waving?of the load. half waving of the load may destroy the power triac and the load. figure 8 shows the dependency of the triac drivers i ft versus the reapplied voltage rise with a vp of 400v. this dv/dt condition simulates a worst case commutating dv/dt amplitude. it can be seen that the i ft does not change until a commutating dv/dt reaches 1000v/ms. the data sheet specified i ft is therefore applicable for all practical inductive loads and load factors.
?005 fairchild semiconductor corporation www.fairchildsemi.com MOC3051M, moc3052m rev. 1.0.5 7 MOC3051M, moc3052m ?6-pin dip random-phase optoisolators triac drivers (600 volt peak) t(delay), t(f) versus i ft the triac driver? turn on switching speed consists of a turn on delay time t(d) and a fall time t(f). figure 9 shows that the delay time depends on the led trigger current, while the actual trigger transition time t(f) stays constant with about one micro second. the delay time is important in very short pulsed opera- tion because it demands a higher trigger current at very short trigger pulses. this dependency is shown in the graph i ft vs. led pw. the turn on transition time t(f) combined with the power triac? turn on time is important to the power dissipation of this device. 1. the mercury wetted relay provides a high speed repeated pulse to the d.u.t. 2. 100x scope probes are used, to allow high speeds and v oltages. 3. the worst-case condition for static dv/dt is established by triggering the d.u.t. with a normal led input current, then removing the current. the variable r test allows the dv/dt to be gradually increased until the d. u. t. continues to trigger in response to the applied v oltage pulse, even after the led current has been removed. the dv/dt is then decreased until the d.u.t. stops triggering. rc is measured at this point and recorded. scope i ft v tm t(d) t(f) zero cross detector ext . sync v out function generator phase ctrl. pw ctrl. period ctrl. v o ampl. ctrl. i ft v tm 10k ? dut 100 ? isol. transf. ac 115 vac switching time test circuit figure 9. delay time, t(d), and fall time, t(f), vs. led trigger current i ft - led trigger current (ma) t(delay) and t(fall) ( s) 10 20 30 40 50 60 0.1 1 10 t d t f figure 10. static dv/dt test circuit +400 vdc pulse input r test c test r = 1k ? mercury wetted relay d.u.t. x100 scope probe applied voltage waveform v max = 400v dv/dt = 0.63v rc 252 rc = rc 252v 0 volts
?005 fairchild semiconductor corporation www.fairchildsemi.com MOC3051M, moc3052m rev. 1.0.5 8 MOC3051M, moc3052m ?6-pin dip random-phase optoisolators triac drivers (600 volt peak) figure 11. basic driver circuit figure 12. triac driver circuit for noisy environments figure 13. triac driver circuit for extremely noisy environments v cc ret . r led triac driver power triac ac line load r q control r triac driver power triac r led v cc ret. control r s c s mov load ac line r triac driver power triac r s c s mov load ac line v cc ret. control r led r led = (v cc - v f led - v sat q)/i ft r = v p ac line/i tsm t ypical snubber values r s = 33 ? , c s = 0.01 f mov (metal oxide varistor) protects triac and driver from transient overvoltages >v drm max. recommended snubber to pass ieee472 and iec255-4 noise tests r s = 47 ? , c s = 0.01 f applications guide basic triac driver circuit the new random phase triac driver family moc3052m and MOC3051M are very immune to static dv/dt which allows snubberless operations in all applications where external generated noise in the ac line is below its guar- anteed dv/dt withstand capability. for these applications a snubber circuit is not necessary when a noise insensi- tive power triac is used. figure 11 shows the circuit diagram. the triac driver is directly connected to the triac main terminal 2 and a series resistor r which limits the current to the triac driver. current limiting resistor r must have a minimum value which restricts the current into the driver to maximum 1a. r = vp ac/i tm max rep. = vp ac/1a the power dissipation of this current limiting resistor and the triac driver is very small because the power triac carries the load current as soon as the current through driver and current limiting resistor reaches the trigger current of the power triac. the switching transition times for the driver is only one micro second and for power triacs typical four micro seconds. t riac driver circuit for noisy environments when the transient rate of rise and amplitude are expected to exceed the power triacs and triac drivers maximum ratings a snubber circuit as shown in figure 12 is recommended. fast transients are slowed by the r-c snubber and excessive amplitudes are clipped by the metal oxide varistor mov. t riac driver circuit for extremely noisy environments as specified in the noise standards ieee472 and iec255-4. industrial control applications do specify a maximum transient noise dv/dt and peak voltage which is super- imposed onto the ac line voltage. in order to pass this environment noise test a modified snubber network as shown in figure 13 is recommended.
?005 fairchild semiconductor corporation www.fairchildsemi.com MOC3051M, moc3052m rev. 1.0.5 9 MOC3051M, moc3052m ?6-pin dip random-phase optoisolators triac drivers (600 volt peak) package dimensions through hole surface mount 0.4" lead spacing recommended pad layout for surface mount leadform note: all dimensions are in inches (millimeters). 0.350 (8.89) 0.320 (8.13) 0.260 (6.60) 0.240 (6.10) 0.300 (7.62) 0.070 (1.77) 0.040 (1.02) 0.014 (0.36) 0.010 (0.25) 0.200 (5.08) 0.115 (2.93) 0.100 (2.54) 0.015 (0.38) 0.020 (0.50) 0.016 (0.41) 0.100 (2.54) 15 0.012 (0.30) pin 1 id seating plane 0.350 (8.89) 0.320 (8.13) 0.260 (6.60) 0.240 (6.10) 0.390 (9.90) 0.332 (8.43) 0.070 (1.77) 0.040 (1.02) 0.014 (0.36) 0.010 (0.25) 0.300 (7.62) 0.035 (0.88) 0.006 (0.16) 0.012 (0.30) 0.008 (0.20) 0.200 (5.08) 0.115 (2.93) 0.025 (0.63) 0.020 (0.51) 0.020 (0.50) 0.016 (0.41) 0.100 [2.54] pin 1 id seating plane 0.350 (8.89) pin 1 id 0.320 (8.13) 0.260 (6.60) 0.240 (6.10) 0.070 (1.77) seating plane 0.040 (1.02) 0.014 (0.36) 0.010 (0.25) 0.200 (5.08) 0.115 (2.93) 0.020 (0.50) 0.016 (0.41) 0.100 (2.54) 0.100 (2.54) 0.015 (0.38) 0.012 (0.30) 0.008 (0.21) 0.425 (10.80) 0.400 (10.16) 0.070 ( 1.78 ) 0.060 ( 1.52 ) 0.030 ( 0.76 ) 0.100 ( 2.54 ) 0.305 ( 7.75 ) 0.425 ( 10.79 )
?005 fairchild semiconductor corporation www.fairchildsemi.com MOC3051M, moc3052m rev. 1.0.5 10 MOC3051M, moc3052m ?6-pin dip random-phase optoisolators triac drivers (600 volt peak) ordering information marking information option order entry identi?er (example) description no option MOC3051M standard through hole device s moc3051sm surface mount lead bend sr2 moc3051sr2m surface mount; tape and reel t moc3051tm 0.4" lead spacing v moc3051vm vde 0884 tv moc3051tvm vde 0884, 0.4" lead spacing sv moc3051svm vde 0884, surface mount sr2v moc3051sr2vm vde 0884, surface mount, tape and reel moc3051 1 2 6 4 3 5 *note ?parts that do not have the ??option (see definition 3 above) that are marked with date code ?25?or earlier are marked in portrait format. de?nitions 1f airchild logo 2d e vice number 3 vde mark (note: only appears on parts ordered with vde option ?see order entry table) 4 one digit year code, e.g., ? 5t wo digit work week ranging from ?1 to ?3 6 assembly package code v x yy q
?005 fairchild semiconductor corporation www.fairchildsemi.com MOC3051M, moc3052m rev. 1.0.5 11 MOC3051M, moc3052m ?6-pin dip random-phase optoisolators triac drivers (600 volt peak) tape dimensions note: all dimensions are in millimeters. 4.0 0.1 1.5 min user direction of feed 2.0 0.05 1.75 0.10 11.5 1.0 24.0 0.3 12.0 0.1 0.30 0.05 21.0 0.1 4.5 0.20 0.1 max 10.1 0.20 9.1 0.20 1.5 0.1/-0
?005 fairchild semiconductor corporation www.fairchildsemi.com MOC3051M, moc3052m rev. 1.0.5 12 MOC3051M, moc3052m ?6-pin dip random-phase optoisolators triac drivers (600 volt peak) re?ow pro?le pro?le freature pb-free assembly pro?le t emperature min. (tsmin) 150? t emperature max. (tsmax) 200? time (t s ) from (tsmin to tsmax) 60?20 seconds ramp-up rate (t l to t p ) 3?/second max. liquidous temperature (t l ) 217? time (t l ) maintained above (t l ) 60?50 seconds p eak body package temperature 260? +0? / ?? time (t p ) within 5? of 260? 30 seconds ramp-down rate (t p to t l ) 6?/second max. time 25? to peak temperature 8 minutes max. time (seconds) te mperature ( c) ti me 25? to peak 260 240 220 200 180 160 140 120 100 80 60 40 20 0 t l t s t l t p t p ts m a x ts m i n 120 preheat area max. ramp-up rate = 3?/s max. ramp-down rate = 6?/s 240 360
?005 fairchild semiconductor corporation www.fairchildsemi.com MOC3051M, moc3052m rev. 1.0.5 13 tradem arks th e following includes registered and unregistered trademarks and service marks, owned by fairchild semiconductor and/or its global subsidiaries ,and is not in tended to be an exhaustive list of all such trademarks. auto-spm build it now coreplus corepower crossvolt ctl current transfer logic ecospark e fficentmax ezswitch* * fair child fairchild semiconductor fa ct quiet series fact f ast fa stvcore fetbench flashwriter * fps f-pfs frfet global power resource sm green fps green fps e-series g max gto in tellimax isoplanar me gabuck mi crocoupler microfet mi cropak m illerdrive moti onmax mo tion-spm optologic op toplanar pdp spm powe r-spm po we rtrench powerxs pr ogrammable active droop qfet qs quiet series r apidconfigure saving our world, 1mw/w/kw at a time sm artmax smart start spm stealth s uperfet sup ersot -3 s upersot -6 s upersot -8 s upremos syncfet sy nc-lock * th ep ower franchise ti nyboost tinybuck ti nylogic tinyopto tinypower tinypwm tinywire trifault detect t ruecurrent * serdes uhc ultra frfet unifet vcx vi sualmax xs *t rademarks of system general corporation, used under license by fairchild semiconductor. disclaimer fa i rchild semiconductor reserves the right to make changes without further notice to any products herein to improve reliability, function, or design. fairchild does not assume any liability arising out of the application or use of any product or circuit described herein; neither does it convey any license under its patent rights, nor the rights of others. these specifications do not expand the terms of fairchild? worldwide terms and conditions, specifically the warranty therein, which covers t hese products. li fe support policy fa i rchild? products are not authorized for use as critical components in life support devices or systems without the express written approval of fairchild semiconductor corporation. as used herein: 1. life support devices or systems are devices or systems which, (a) are in tended for surgical implant into the body or (b) support or sustain life, and (c) whose failure to perform when properly used in accordance wi th instructions for use provided in the labeling, can be reasonably expected to result in a significant injury of the user. 2. a critical component in any component of a life support, device, or system whose failure to perform can be reasonably expected to cause the failure of the life support device or system, or to affect its safety or effectiveness. an ti -counterfeiting policy fairchild semiconductor corporation's anti-counterfeiting policy. fairchild's anti-counterfeiting policy is also stated on our external websi te, www.fairchildsemi.com, under sales support. c ounterfeiting of semiconductor parts is a growing problem in the industry. all manufacturers of semiconductor products are experiencing counterf eiting of their parts. cu stomers who inadvertently purchase counterfeit parts experience many problems such as loss of brand reputation, substandard performance, faile da pplications, and increased cost of production and manufacturing delays. fairchild is taking strong measures to protect ourselves and our customers from the proli feration of counterfeit parts. fairchild strongly encourages customers to purchase fairchild parts either directly from fairchild or from authorized fairchi ld dist ributors who are lis ted by country on our web page cited above. products customers buy either from fairchild directly or from authorized fairchild distributors are ge nuine parts, have full traceability, meet fairchild's quality standards for handling and storage and provide access to fairchild's full range of up-to-date technica land product information. fairchild and our authorized distributors will stand behind all warranties and will appropriately address any warranty issues that may arise. fairc hild will not provide any warranty coverage or other assistance for parts bought from unauthorized sources. fairchild is committed to combat this global problem and encou rage our customers to do their part in stopping this practice by buying direct or from authorized distributors. product status definitions defi nition of terms da tasheet identification product st atus definition ad vance information formative / in design datasheet contains the design specifi cations for product development. s pecifications may change in any manner without notice. pr eliminary datasheet contains preliminary data; supplementary data will be published at a later date. fairchild se mi conductor reserves the right to make changes at any time without notice to improve design. no i dentification needed full production datasheet contains final specifications. fairchi ld semiconductor reserves the right to make changes at any time without notice to improve the design. obsolete not in production datasheet contains specifications on a product that is discontinued by fairchild semiconductor. th e datasheet is for reference information only. rev. i40 first production MOC3051M, moc3052m ?6-pin dip random-phase optoisolators triac drivers (600 volt peak)

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